Simplified attenuated total reflection apparatusVILLAGRAN, J. C; THOMPSON, J. C.Review of scientific instruments. 1989, Vol 60, Num 6, pp 1201-1202, issn 0034-6748Article

Quantitative ATR-spektrokopie in einem 3-Schicht-System = Spectroscopie de réflexion totale atténuée quantitative dans un système à 3 couches = Quantitative ATR spectroscopy within a 3-layer-systemABRAHAM, K; MÜLLER, G.Optik (Stuttgart). 1985, Vol 70, Num 1, pp 29-32, issn 0030-4026Article

Surface polaritons of a left-handed material slabRUPPIN, R.Journal of physics. Condensed matter (Print). 2001, Vol 13, Num 9, pp 1811-1818, issn 0953-8984Article

New quantitative technique for attenuated total reflection (ATR) spectrophotometry. Calibration of the CIRCLE ATR device in the infraredSPERLINE, R. P; MURALIDHARAN, S; FREISER, H et al.Applied spectroscopy. 1986, Vol 40, Num 7, pp 1019-1022, issn 0003-7028Article

Bulk polaritons in K₂Mg₂(SO₄)₃ observed by the ATR-methodBEHMER, M.Zeitschrift für Naturforschung. Teil A : Physik, physikalische Chemie, Kosmophysik. 1985, Vol 40, Num 9, pp 944-946, issn 0340-4811Article

Bestimmung diffusionsspezifischer Parameter mit Hilfe der IR-ATR-Spektroskopie = Détermination des paramètres spécifiques de diffusion à l'aide de la spectroscopie de réflexion totale atténuée en IR = Determination of diffusion specific parameters by means of IR total attenuated reflectionBRANDT, H.Experimentelle Technik der Physik. 1985, Vol 33, Num 5, pp 423-431, issn 0014-4924Article

Re-radiation from surface-plasmon-polaritons by surface roughness = Re-rayonnement de polaritons de plasmons de surface par la rugosité de surfaceBARNES, W. L; SAMBLES, J. R.Solid state communications. 1985, Vol 55, Num 11, pp 921-923, issn 0038-1098Article

Salivary film formation on defined solid surfaces in the absence and presence of microorganismsCHRISTERSSON, C. E; DUNFORD, R. G.Biofouling (Print). 1991, Vol 3, Num 3, pp 237-250, issn 0892-7014Article

ATR signal enhancement via simplification of system opticsMILLER, M. P; PENSKI, E. C.Applied spectroscopy. 1987, Vol 41, Num 6, issn 0003-7028, 1079Article

Accelerometer design based on attenuated total reflectionBO-SHEN ZHU; OWNER -PERTERSEN, M; LICHT, T et al.Applied optics. 1988, Vol 27, Num 14, pp 2972-2975, issn 0003-6935Article

Bistable optical behavior of a nonliner attenuated total reflection device: resonant excitation of nonlinear guided modesREINISCH, R; ARLOT, P; VITRANT, G et al.Applied physics letters. 1985, Vol 47, Num 12, pp 1248-1250, issn 0003-6951Article

Determination of polydimethylsiloxane on cotton fabrics using Fourier transform attenuated total reflection infrared spectroscopySHREEDHARA MURTHY, R. S; LEYDEN, D. E; D'ALONZO, R. P et al.Applied spectroscopy. 1985, Vol 39, Num 5, pp 856-860, issn 0003-7028Article

Optical bistability from surface plasmon excitation through a nonlinear mediumMARTINOT, P; LAVAL, S; KOSTER, A et al.Journal de physique (Paris). 1984, Vol 45, Num 3, pp 597-600, issn 0302-0738Article

In situ studies on oxidation of copper films by using ATR technique = Etudes in situ de l'oxydation de couches de cuivre par la technique de réflexion totale atténuéeTAJIMA, N; FUKUI, M; SHINTANI, Y et al.Journal of the Physical Society of Japan. 1985, Vol 54, Num 11, pp 4236-4240, issn 0031-9015Article

Optical properties of thin layers of SiO_xLEVY, Y; JURICH, M; SWALEN, J. D et al.Journal of applied physics. 1985, Vol 57, Num 7, pp 2601-2605, issn 0021-8979Article

REFRACTOMETRIE DE LA REFLEXION INTERNE TOTALE CONTRARIEESHAKARYAN EH S; MOLOCHNIKOV BI; SUTOVSKIJ SM et al.1977; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1977; VOL. 44; NO 12; PP. 47-53; BIBL. 48 REF.Article

EXPERIMENTAL OBSERVATION OF THE UPPER POLARITON BRANCH IN ISOTROPIC CRYSTALS.FORNARI B; PAGANNONE M.1978; PHYS. REV., B; USA; DA. 1978; VOL. 17; NO 8; PP. 3047-3050; BIBL. 23 REF.Article

TWO-INTERFACE SURFACE-POLARITON MODES: GAAS EPITAXIAL FILM ON GAAS SUBSTRATE.HOLM RT; PALIK ED.1978; PHYS. REV., B; USA; DA. 1978; VOL. 17; NO 6; PP. 2673-2681; BIBL. 24 REF.Article

REFRACTOMETRE A REFLEXION TOTALE INTERNE ATTENUEE POUR LA MESURE DES CONSTANTES OPTIQUES DES MILIEUX ABSORBANTSMOLOCHNIKOV BI; LEJKIN MV; VASIL'EVA IS et al.1979; OPT.-MEKH. PROMYSHL.; SUN; DA. 1979; NO 2; PP. 26-28; BIBL. 6 REF.Article

FILTRE MULTICOUCHE SPATIALEMENT LIMITE A REFLEXION TOTALE INTERNE ATTENUEEMALOV VV; IOGANSEN LV.1980; OPT. I SPEKTROSK.; SUN; DA. 1980; VOL. 48; NO 1; PP. 146-154; BIBL. 9 REF.Article

THE USE OF ATTENUATED TOTAL REFLECTANCE (ATR) IN DETERMINING THE NATURE OF A COATING ON A PAPERBOBER A; BERKSHIRE RC.1979; APPL. SPECTROSC.; USA; DA. 1979; VOL. 33; NO 2; PP. 184-186; BIBL. 5 REF.Article

ELEMENT A REFLEXION TOTALE INTERNE ATTENUEE ACCORDABLE EN FONCTION DE L'ANGLE D'INCIDENCE DES FAISCEAUX LUMINEUX FORTEMENT COLLIMATESMOLOCHNIKOV BI; VASIL'EVA IS; GUBEL NN et al.1979; OPT.-MEKH. PROMYSHL.; SUN; DA. 1979; NO 11; PP. 26-28; BIBL. 4 REF.Article

CALCUL OPERATIF DES CONSTANTES OPTIQUES DETERMINEES PAR UNE METHODE DE REFLEXION TOTALE INTERNE ATTENUEESHMULEVICH MI; SHAKARYAN EH S; ZOLOTAREV VM et al.1978; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1978; VOL. 45; NO 3; PP. 58-60; BIBL. 4 REF.Article

EXCITATION OF SURFACE ELECTROMAGNETIC WAVES IN ATTENUATED TOTAL-REFLECTION PRISM CONFIGURATIONS.CHEN WP; RITCHIE G; BURSTEIN E et al.1976; PHYS. REV. LETTERS; U.S.A.; DA. 1976; VOL. 37; NO 15; PP. 993-997; BIBL. 9 REF.Article

VERSATILE FRUSTRATED-TOTAL-REFRACTION POLARIZER FOR THE INFRAREDLEES D; BAUMEISTER P.1979; OPT. LETTERS; USA; DA. 1979; VOL. 4; NO 2; PP. 66-67; BIBL. 7 REF.Article